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CEMS Topical Meeting Online

Advanced Visualization of Electrons, Atoms, and Molecules

October 29, 2020
RIKEN CEMS

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Overview

Progress in technologies of measurement and analysis is notable because it enables to enlarge the limitations such as sensitivity, spatial resolution, and data accumulation time. Hardware like probing or detection system has been amazingly improving for a couple of decades. Furthermore, development in data processing software based on application of statistical and information technologies has been drastically rising nowadays. This topical meeting is focusing on state-of-the-art technologies in the field of measurement and analysis feasible to characterize emergent matter phenomena by visualization of electrons, atoms, and molecules.

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Program

Thursday, October 29, 2020

13:00 - 13:10Opening
13:10 - 14:00Shigeki Kawai (NIMS)
On-surface chemistry studied with high-resolution scanning probe microscopy
14:00 - 14:35Manabu Hoshino (RIKEN CEMS)
Evaluation of ‘to-be-collected’ diffraction data using information technology
14:35 - 15:10Kenichi Kato (RIKEN RSC)
Data-driven total scattering measurements by synchrotron X-rays ーAiming at visualization of heterogeneous phenomenaー
15:10 - 15:30Break
15:30 - 16:05Ryo Ishikawa (The University of Tokyo)
Advanced electron microscopy for point defects
16:05 - 16:40Keiki Fukumoto (KEK)
Electron dynamics in organic heterostructures
16:40 - 17:30Ken Onda (Kyushu University)
Structural dynamics in photofunctional materials studied by time-resolved infrared spectroscopy
17:30 - 17:40Closing
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Registration

Registercursor

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Download abstract

pdf-icon Abstract.pdf (3.3MB)

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Contact us

For help and further information, please contact:

Secretariat of CEMS Topical Meeting Online
Materials Characterization Support Team, RIKEN CEMS
Address: 2-1 Hirosawa, Wako, Saitama 351-0198, JAPAN
Email: manabu.hoshino@riken.jp

Organizer

  • Manabu Hoshino (RIKEN CEMS)
  • Daisuke Hashizume (RIKEN CEMS)