Progress in technologies of measurement and analysis is notable because it enables to enlarge the limitations such as sensitivity, spatial resolution, and data accumulation time. Hardware like probing or detection system has been amazingly improving for a couple of decades. Furthermore, development in data processing software based on application of statistical and information technologies has been drastically rising nowadays. This topical meeting is focusing on state-of-the-art technologies in the field of measurement and analysis feasible to characterize emergent matter phenomena by visualization of electrons, atoms, and molecules.

Thursday, October 29, 2020

13:00 - 13:10	Opening
13:10 - 14:00	Shigeki Kawai (NIMS) On-surface chemistry studied with high-resolution scanning probe microscopy
14:00 - 14:35	Manabu Hoshino (RIKEN CEMS) Evaluation of ‘to-be-collected’ diffraction data using information technology
14:35 - 15:10	Kenichi Kato (RIKEN RSC) Data-driven total scattering measurements by synchrotron X-rays ーAiming at visualization of heterogeneous phenomenaー
15:10 - 15:30	Break
15:30 - 16:05	Ryo Ishikawa (The University of Tokyo) Advanced electron microscopy for point defects
16:05 - 16:40	Keiki Fukumoto (KEK) Electron dynamics in organic heterostructures
16:40 - 17:30	Ken Onda (Kyushu University) Structural dynamics in photofunctional materials studied by time-resolved infrared spectroscopy
17:30 - 17:40	Closing

Until noon on November 5, 2020 (Closed)

 Abstract.pdf (3.3MB)

For help and further information, please contact:

Secretariat of CEMS Topical Meeting Online
Materials Characterization Support Team, RIKEN CEMS

Address: 2-1 Hirosawa, Wako, Saitama 351-0198, JAPAN

Email: manabu.hoshino@riken.jp

Organizer

• Manabu Hoshino (RIKEN CEMS)
• Daisuke Hashizume (RIKEN CEMS)