10th CEMS Colloquium
講演者
藤田 誠 （東京大学 教授）
日程
2013年10月2日(水) 17:30～18:30
開催場所
理化学研究所 大河内記念ホール
講演タイトル
結晶スポンジ法：結晶化を必要としない 痕跡量化合物のX線結晶構造解析
講演概要
X-ray single crystal diffraction (SCD) analysis has the intrinsic limitation that the target molecules must be obtained as single crystals. Here, we report a new protocol for SCD analysis that does not require the crystallization of the sample. In our method, tiny crystals of porous complexes are soaked in the solution of a target, where the complexes can absorb the target molecules. The crystallographic analysis clearly determines the absorbed guest structures along with the host frameworks. As the SCD analysis is carried out with only one tiny crystal, the required sample amount is of the nano-to-microgram order. With chiral guests, the space group of the crystal turned into chiral (C2 or P1), enabling the determination of absolute configuration of the guests from the anomalous scattering from the host ZnI2 component. We demonstrate that even ~50 ng of a sample is enough to be analyzed. When combined with high performance liquid chromatography (HPLC), multiple fractions were directly characterized, establishing a prototypical LC-SCD analysis..