78th CEMS Colloquium

講演者

花栗哲郎 (創発物性科学研究センター創発物性計測研究チームチームリーダー)

日程

2019年12月25日(水) 17:00～18:00

開催場所

理化学研究所　大河内記念ホール

講演タイトル

分光イメージング走査型トンネル顕微鏡で見る創発現象

講演概要

Scanning-tunneling-microscopy (STM) is not only an atomic-resolution imaging tool, but also able to measure the electron excitation spectrum by tunneling spectroscopy. Spectroscopic-imaging STM (SI-STM) is an ultimate combination of these two functions; the tunneling spectrum is acquired at every pixel of the atomic-resolution STM topography and thus atomically registered energy-resolved spectroscopic images can be obtained. Fourier analyses of the volume spectroscopic data allow us to access momentum space as well. Since SI-STM works under extreme conditions such as low temperature and high magnetic field, it can be a powerful tool to investigate electronic states behind various emergent phenomena such as high-temperature superconductivity and topological quantum phenomena. I will briefly review how this beautiful technique has been developed and will show how the cutting-edge SI-STM technology elucidates electronic states of emergent materials, using the iron-based superconductor as an example.